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Books by David Seiler
  | | Characterization and Metrology for ULSI Technology 2003: 2003 International Conference on Characterization and Metrology for ULSI Technology (AIP Conference Proceedings) by Stefan Zollner, Robert Mcdonald, David G. Seiler, Alain C. Diebold, Thomas J. Shaffner, Rajinder P. Khosla, Eric M. Secula Hardcover, 836 Pages, Published 2003 by American Institute Of Physics ISBN-13: 978-0-7354-0152-5, ISBN: 0-7354-0152-7 |
 | | Hgcdte Detector Reliability Study for the Goes Program by David G. Seiler by David G. Seiler Hardcover, Published 2017 by Forgotten Books ISBN-13: 978-0-266-93419-6, ISBN: 0-266-93419-6 |
 | | Hgcdte Detector Reliability Study for the Goes Program (Classic Reprint) by David G. Seiler Paperback, 116 Pages, Published 2017 by Forgotten Books ISBN-13: 978-1-5285-0911-4, ISBN: 1-5285-0911-0 |
 | | Characterization and Metrology for Nanoelectronics(1st Edition) 2007 International Conference on Frontiers of Characterization and Metrology (AIP Conference Proceedings / Materials Physics and Applications) by Dan Herr, Robert Mcdonald, David G. Seiler, Alain C. Diebold, C. Michael Garner, Rajinder P. Khosla, Erik M. Secula Hardcover, 592 Pages, Published 2007 by American Institute Of Physics ISBN-13: 978-0-7354-0441-0, ISBN: 0-7354-0441-0 |
 | | Characterization and Metrology for ULSI Technology 2005(1st Edition) (AIP Conference Proceedings / Materials Physics and Applications) by Robert Mcdonald, Stefan Zollner, David G. Seiler, Alain C. Diebold, Caroline R. Ayre, Rajinder P. Khosla, Erik M. Secula Hardcover, 667 Pages, Published 2005 by American Inst. Of Physics ISBN-13: 978-0-7354-0277-5, ISBN: 0-7354-0277-9 |
 | | Characterization and Metrology for ULSI Technology 2000 International Conference (AIP Conference Proceedings) by David G. Seiler, Robert Mcdonald, Alain C. Diebold, Thomas J. Shaffner, W. Murray Bullis, Patrick J. Smith, Erik M. Secula, Eric M. Secula Hardcover, 723 Pages, Published 2001 by American Institute Of Physics ISBN-13: 978-1-56396-967-6, ISBN: 1-56396-967-X |
 | | Life on Hold Finding Hope in the Face of Serious Illness Seiler, David G. and Brunvoll, Laurel S. by Seiler . Brunvoll Paperback, 288 Pages, Published 2001 by Multnomah Publishers ISBN-13: 978-1-57673-760-6, ISBN: 1-57673-760-8 |
 | | Metrology and Diagnostic Techniques for Nanoelectronics by Zhiyong Ma, David G. Seiler 1,454 Pages, Published 2017 by Crc Press ISBN-13: 978-1-351-73395-3, ISBN: 1-351-73395-8 "Campbell, A. N., Mikawa, R. E., and Knorr, D. B. (1993). Relationship between texture and electromigration lifetime in sputtered Al-1- percent Sithin-films,J. Electron. Mater., 22(6), pp. 589-596. Cao, L., Ganesh, K.J., Zhang, L., Aubel, O., Hennesthal, C., Hauschildt, M., Ferreira, P.J., and Ho, P. S. (2013). Grainstructure analysis and effect on electromigration reliability in nanoscale Cu interconnects, Appl. Phys. Lett., 102(13 ..." |
 | | Metrology and Diagnostic Techniques for Nanoelectronics by Zhiyong Ma, David G. Seiler 1,454 Pages, Published 2017 by Crc Press ISBN-13: 978-1-351-73394-6, ISBN: 1-351-73394-X "(2010), Transvers-optical phonons excited in Si using a high-numerical-aperture lens, Appl. Phys. Lett. ... Spectroscopic techniques for MEMS inspection, in Optical Inspection of Microsystems, ed. Osten ... Murugesan, M., Ohara Y., Bea, J. , Lee ..." |
 | | The Spectroscopy of Semiconductors, Volume 36 (Semiconductors and Semimetals) by Robert K. Willardson, David G. Seiler, Christopher L. Littler, Albert C. Beer, Eicke R. Weber Hardcover, 435 Pages, Published 1992 by Academic Press ISBN-13: 978-0-12-752136-7, ISBN: 0-12-752136-4 |
 | | Narrow-Gap Semiconductors and Related Materials, Proceedings of the INT Conference on Narrow-Gap Semiconductors and Related Materials, NIST, Gaithersburg, June 12-15, 1989(1st Edition) by David G. Seiler, Christopher L. Littler Hardcover, 364 Pages, Published 1990 by Crc Press ISBN-13: 978-0-85274-210-5, ISBN: 0-85274-210-X "The special characteristics of narrow-gap semiconductors have long been recognised, not only for their interesting physical effects, but also for their technological applications. Such materials are found across a wide range of elements, compounds and alloys. The International Conference on Narrow-gap Semiconductors and Materials (NIST, Gaithersburg) reviewed past research into the physics of both materials and devices, and summarised t ..." |
 | | Life on Hold Finding Hope in the Face of Serious Illness by David G. Seiler, Laurel Seiler Brunvoll Paperback, 288 Pages, Published 2006 by Multnomah ISBN-13: 978-1-59052-827-3, ISBN: 1-59052-827-1 "Beyond sending a "get-well card," many people know little about supporting someone through a serious illness -- let alone passing through one themselves. Life on Hold answers the need of many people who face -- or may soon be faced with -- a health crisis of longer duration. Written by a father and daughter who lost their wife and mother to an extended battle with cancer, this sensitive personal journal is dotted with illustrations from ..." |
 | | Metrology and Diagnostic Techniques for Nanoelectronics(1st Edition) by Zhiyong Ma, David G. Seiler Hardcover, 1,454 Pages, Published 2016 by Pan Stanford ISBN-13: 978-981-4745-08-6, ISBN: 981-4745-08-1 |
 | | Characterization and Metrology for Ulsi Technology(1st Edition) 1998 International Conference (AIP Conference Proceedings, Vol. 449 With CD ROM) by R. Mcdonald, David G. Seiler, W.M. Bullis, A.C. Diebold, T.J. Shaffner, E.J. Walters, Alain C. Diebold, Robert Mcdonald, W. Murray Bullis Hardcover, 960 Pages, Published 1998 by American Inst. Of Physics ISBN-13: 978-1-56396-753-5, ISBN: 1-56396-753-7 |
 | | BFF Handbuch Basiswissen für selbstständige Fotografen, für Studenten und Assistenten, für Repräsentanten und für alle, die bereits beruflich tätig sind oder sich selbstständig machen wollen(1st Edition) by Wolfgang Maaßen, Tanja Braune, Wolfgang Emmerling, Anna Gripp, Dieter Kahl, Thomas Kettner, Christ Klubert, Margarete May, Susanne Nagel, Heiko Preller, Christian Schmidt, David Seiler, Bernd Weise, Christian Sprotte Hardcover, 332 Pages, Published 2005 by Bund Freischaffender Foto-Designer (Bff) ISBN-13: 978-3-933989-28-4, ISBN: 3-933989-28-0 |
 | | Internet- Recht im Unternehmen. B2B, B2C in der Praxis. by Matthias Pierson, David Seiler Paperback, 491 Pages, Published 2002 by Dtv-Beck ISBN-13: 978-3-423-05686-1, ISBN: 3-423-05686-X |
 | | Praktikerhandbuch Marktfolge Passiv zentrale Dienstleistungen by Stefan Fritz, Thomas O. Günther, Hakan Güzel, Rainer Hahn, Andreas Hana, Björn Heinen, Philipp Hendel, Silke Heisterkamp, Hanspeter Karstens, Hendrik Müller, Ulrich Christoph Müller, Susanne Pfleiderer, Jörg Plesse, Kathrin Rott, Dieter Schäfer, Judith Schäpers, David Seiler, Michael Brinkmann, Andreas Kirsch, Beate Käppel-Schäfer, Heinz-Theo Schmidt, Elmar Scholz Hardcover, 692 Pages, Published 2010 by Finanz Colloquium Heidelberg ISBN-13: 978-3-940976-46-8, ISBN: 3-940976-46-6 |
 | | Characterization and metrology for ULSI technology 1998 international conference, Gaithersburg, Maryland, March 1998 (AIP conference proceedings) by David G. Seiler Cd, 960 Pages, Published 1998 by American Institute Of Physics ISBN-13: 978-1-56396-868-6, ISBN: 1-56396-868-1 |
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