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Books by Yinghua Min






VLSI Test Principles and Architectures(1st Edition)
Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
by Laung-Terng Wang, Xiaoqing Wen, Cheng-Wen Wu, Abhijit Chatterjee, Xinghao Chen, William Eklow, Soumendu Bhattacharya, Rohit Kapur, Brion Keller, Xiaowei Li, Yinghua Min, Mehrdad Nourani, Janusz Rajski, Charles Stroud, Erik H. Volkerink, Kwang-Ting Cheng, Michael S. Hsiao, Jiun-Lang Huang, Shi-Yu Huang, Wen-Ben Jone, Kuen-Jong Lee, Mike Peng Li, T.M. Mak, Benoit Nadeau-Dostie, Duncan M. Walker, Shianling Wu, Nur A. Touba
Hardcover, 808 Pages, Published 2006 by Morgan Kaufmann
ISBN-13: 978-0-12-370597-6, ISBN: 0-12-370597-5

"This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. · Most up-to-date coverage of design for testability. · Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. · Numer ..."






Grenzgänge
nord- und südkoreanische Kunst aus der Sammlung Sigg = Border crossings : North and South Korean art from the Sigg collection. Kunstmuseum Bern;
by Bern: Kunstmuseum, Kathleen Bühler, Sunhee Kim, Nina Zimmer
Paperback, 280 Pages, Published 2021 by Hatje Cantz, Ostfildern
ISBN-13: 978-3-7757-4916-9, ISBN: 3-7757-4916-0






Wang Yin
by Carol Yinghua Lu, Jing Zuo, Contributor-Min'an Wang, Wang Yin, Lucy Li, Asea Dai, Min'an Wang, Wang Min An
Hardcover, 136 Pages, Published 2011 by Blue Kingfisher
ISBN-13: 978-988-18816-3-2, ISBN: 988-18816-3-3

All Authors

Soumendu Bhattacharya

Benoit Nadeau-Dostie

Mehrdad Nourani

Charles Stroud

Janusz Rajski

Mike Peng Li

Shi-Yu Huang

Xiaowei Li

Yinghua Min

Mak


All Bindings

Hardcover

Paperback


All Editions

1st Edition

Other


All Years

2021

2011

2006


All Regions

English

Hong Kong, China

German