 | |
  | |
| Searching ... |
| 0 % | ||
Books by John Bravman
  | | 35 Annual Review of Materials Research 2005 (ANNUAL REVIEW OF MATERIALS RESEARCH 2004) by Manfred Ruhle, John M. Thomas, Pratibha L. Gai, David R. Clarke, John C. Bravman, Samuel I. Stupp Hardcover, 662 Pages, Published 2005 by Annual Reviews ISBN-13: 978-0-8243-1735-5, ISBN: 0-8243-1735-1 |
 | | Annual Review of Materials Research(1st Edition) by Evelyn Hu, Manfred Ruhle, David R. Clarke, John C. Bravman Hardcover, 451 Pages, Published 2004 by Annual Reviews ISBN-13: 978-0-8243-1734-8, ISBN: 0-8243-1734-3 |
 | | Laser Ablation for Materials Synthesis Volume 191 (MRS Proceedings) by David C. Paine, John C. Bravman Paperback, 264 Pages, Published 2014 by Cambridge University Press ISBN-13: 978-1-107-41009-1, ISBN: 1-107-41009-6 |
 | | Annual Review of Materials Science(1st Edition) 2003: 33 (Annual Review of Materials Research) by David R. Clarke, Manfred Ruhle, Kaus-Dieter Kreuer, John C. Bravman Hardcover, Published 2003 by Annual Reviews ISBN-13: 978-0-8243-1733-1, ISBN: 0-8243-1733-5 |
 | | Materials Reliability in Microelectronics VIII(1st Edition) Volume 516 (MRS Proceedings) by John C. Bravman, Thomas N. Marieb, Matt A. Korhonen, James R. Lloyd, John R. Lloyd Hardcover, 365 Pages, Published 1998 by Materials Research Society ISBN-13: 978-1-55899-422-5, ISBN: 1-55899-422-X |
 | | Thin Films(1st Edition) Volume 130: Stresses and Mechanical Properties I (MRS Proceedings) by John C. Bravman, David M. Barnett, William D. Nix, David A. Smith Hardcover, 402 Pages, Published 1989 by Cambridge University Press ISBN-13: 978-1-55899-003-6, ISBN: 1-55899-003-8 |
 | | 38(1st Edition) Annual Review of Materials Research 2008 by Manfred Ruhle, David R. Clarke, John M. Thomas, Pratibha L. Gai, John C. Bravman, Antoni P. Tomsia Hardcover, 587 Pages, Published 2008 by Annual Reviews ISBN-13: 978-0-8243-1738-6, ISBN: 0-8243-1738-6 |
 | | Advanced Processing and Characterization of Semiconductors III (Proceedings of Spie) by A. Ourmazd, J. J. Song, John C. Bravman, Et.Al., Devendra K. Sadana Paperback, 272 Pages, Published 1986 by Society Of Photo Optical ISBN-13: 978-0-89252-658-1, ISBN: 0-89252-658-0 |
 | | Specimen Preparation for Transmission Electron Microscopy of Materials(1st Edition) (Materials Research Society Symposium Proceedings) by John C. Bravman, Ron M. Anderson, Michael L. Mcdonald, Materials Research Society Hardcover, 292 Pages, Published 1988 by Materials Research Society ISBN-13: 978-0-931837-83-8, ISBN: 0-931837-83-9 |
 | | Stress-Induced Phenomena in Metallization Third International Workshop (AIP Conference Proceedings, No. 373) by John Bravman, John Sanchez, Paul S. Ho, Che-Yu Li Hardcover, 304 Pages, Published 1996 by American Institute Of Physics ISBN-13: 978-1-56396-439-8, ISBN: 1-56396-439-2 "Third International Workshop Paul S. Ho, John Bravman, Che-Yu Li, John Sanchez ... For lines without a refractory underlayer but with a value of w/d close to that of the lines used here (1.4) and under con di tons where he believed interface ..." |
 | | Specimen Preparation for Transmission Electron Microscopy of Materials III(1st Edition) Volume 254 (MRS Proceedings) by Ron Anderson, Bryan Tracy, John Bravman Hardcover, 287 Pages, Published 1992 by Materials Research Society ISBN-13: 978-1-55899-148-4, ISBN: 1-55899-148-4 "The system is based on an existing focused ion beam machine which is able to image and mill selected areas of specimens that are too thick for TEM studies. The specimen image is formed using either secondary electrons or secondary ions, ..." |
 | | Laser Ablation for Materials Synthesis Symposium Held April 19-20, 1990, San Francisco, California, U.S.A (Materials Research Society Symposium, V.) by David C. Paine, John C. Bravman, D.C. Paine Hardcover, 239 Pages, Published 1990 by Materials Research Society ISBN-13: 978-1-55899-080-7, ISBN: 1-55899-080-1 |
 | | 37 Annual Review of Materials Research 2007 by Manfred Ruhle , John M. Thomas , Pratibha L. Gai , David R. Clarke , John C. Bravman , Samuel I. Stupp Hardcover, 771 Pages, Published 2007 by Annual Reviews ISBN-13: 978-0-8243-1737-9, ISBN: 0-8243-1737-8 |
 | | Thin Films Volume 130: Stresses and Mechanical Properties I (MRS Proceedings) by John C. Bravman , William D. Nix , David M. Barnett , David A. Smith Paperback, 428 Pages, Published 2014 by Cambridge University Press ISBN-13: 978-1-107-41085-5, ISBN: 1-107-41085-1 |
All Authors
All Bindings
All Years
John Bravman
Evelyn Hu, David R. Clarke, Manfred Ruhle, John C. Bravman
Paine, David C. (Editor), and Bravman, John C. (Editor)
All Bindings
All Years